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Table 1-10 Test port input levels
Description Specification Typical
Maximum test port input level
300 kHz to 3 GHz +10 dBm
Damage level
300 kHz to 3 GHz +20 dBm, ±30 VDC
Crosstalk1
300 kHz to 3 GHz –110 dB
Table 1-11 Test port input (trace noise2)
Description Specification Typical
Trace noise magnitude
300 kHz to 1 MHz 8 mdB rms (23 °C ±5 °C)
(source power level = +10 dBm)
1 MHz to 3 GHz 5 mdB rms (23 °C ±5 °C)
(source power level = +10 dBm)
Trace noise phase
300 kHz to 1 MHz 0.05° rms (23 °C ±5 °C)
(source power level = +10 dBm)
1 MHz to 3 GHz 0.03° rms (23 °C ±5 °C)
(source power level = +10 dBm)
Test port input
1. Response calibration not omitted.
2. Trace noise is defined as a ratio measurement of a through, at IF bandwidth = 3 kHz.
3. Stability is defined as a ratio measurement at the test port.
Table 1-12 Test port input (stability 3)
Description Specification Typical
Stability magnitude
3 MHz to 3 GHz 0.01 dB/°C
(at 23 °C ±5 °C)
Stability phase
3 MHz to 3 GHz 0.1°/°C
(at 23 °C ±5 °C)